Solar photovoltaic (PV) cell manufacturing has grown significantly to satisfy the demand for the clean electrical energy produced from solar cells. The appearance of solar panels is now a common site on rooftops around the world. To help control the quality and efficiency of the manufactured cells, Nanometrics offers a variety of tools to provide feedback on production variations.
Included in Nanometrics’ Trajectory product line, the TSM is designed to rapidly measure the thickness of various thin films in order to enable fast feedback and excursion prevention in the manufacture of all types of solar PV cells, and further expands Nanometrics’ metrology system footprint into the segment of rough and textured PV film layers. The TSM is optimized for film measurement on high throughput processes, enabling control on textured crystalline silicon cells, complex multi-junction thin film silicon cells and high-roughness CIGS (copper indium gallium (di)selenide) and cadmium telluride (CdTe) films.