Nanometrics
Spectroscopic Ellipsometry

SPECTROSCOPIC ELLIPSOMETRY

Like reflectometry, ellipsometry is a non-contact and non-destructive technique used to analyze and measure films. An ellipsometer analyzes the change in light polarization after reflection from a film's surface and interfaces. The systems are spectroscopic, providing ellipsometric data at many different wavelengths. Spectroscopic ellipsometry provides a wealth of information about a film, yielding very accurate and reliable measurements.