As the availability of consumer multimedia applications expands, so does the need for data storage media. Drive manufacturers, working to increase the performance and density of hard drives by shrinking device geometries, are encountering new challenges. Among these are the need to achieve uniform device features in thin film heads, as well as to measure film thickness and characterize surface topography.
Our advanced metrology solutions help our customers to measure these important characteristics and to correct manufacturing issues, leading to increased product yields. At Nanometrics, we provide a range of advanced process control metrology tools to solve the complex problems associated with developing next-generation data storage media. These solutions reduce manufacturing costs by helping our customers speed development and avoid costly excursions.