Nanometrics
Trajectory TSM Series

TSM

Trajectory Solar Monitor

 

TSM is a state-of-the-art metrology product line for thin film PV manufacturing lines. Approved for in-situ integration by leading PV developers, TSM products push the metrology performance envelope for robustness, reliability, and cost implementing flexible fiber coupled sensor architecture. With optimized optics enabling high tilt and roughness tolerance and simple yet powerful spectral detectors, cost is minimized at a MTBF >10,000 hours.

 

The TSM product line is offered in several configurations for a broad range of applications.

  • UV-Vis reflectometry for buffer and TCO layers thickness and composition measurement.
  • Near Infra-red reflectometry for CIGS/CdTe thickness and composition measurement
  • NIR-base photoluminescence for CIGS/CdTe band gap analysis.