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ARCHIVE PRESS RELEASES [2006]
12/07/2006 Nanometrics Reports Favorable Markman Ruling in Patent Dispute
11/02/2006 Nanometrics Reports Financial Results for the Third Quarter of 2006
10/26/2006 Nanometrics and ASML Enter Into Cross-Licensing Agreement for Advanced Overlay and CD Control Metrology Technology
10/18/2006 Nanometrics Introduces VerteX Rapid Photoluminescence Mapping System for Compound Semiconductors
10/11/2006 Nanometrics Files New Complaint Against Nova Measuring Instruments for Patent Infringement
08/28/2006 Nanometrics Sets New Date for 2006 Annual Meeting
07/31/2006 Nanometrics Announces Upcoming Investor Conference Events
07/27/2006 Nanometrics Reports Financial Results for the Second Quarter of 2006
07/21/2006 Nanometrics Completes Acquisition of Accent Optical Technologies
06/22/2006 Nanometrics Announces Date of Shareholder Meeting to Vote on Acquisition of Accent Optical
04/25/2006 Nanometrics Reports Financial Results for the First Quarter of 2006
04/12/2006 Nanometrics Announces Increased Revenue Guidance for the First Quarter of 2006 and Details of its Financial Results Release and Conference Call
03/30/2006 Nanometrics Sues Nova Measuring Instruments for Patent Infringement
03/20/2006 Nanometrics Receives Stay in Patent Litigation with KLA-Tencor
03/15/2006 Nanometrics Acquires Overlay Metrology Leader Soluris Inc.
02/15/2006 Nanometrics Reports Fourth Quarter and FY Financial Results for 2005
01/31/2006 Nanometrics to Present at the Thomas Weisel Partners Technology Conference
01/25/2006 Nanometrics to Acquire Accent Optical Technologies
01/10/2006 Nanometrics Creates New Position for Vice President of Corporate Quality and Hires Semiconductor Industry Veteran Azmat Siddiqi
01/03/2006 Nanometrics to Present at the at the 8th Annual Needham & Company, LLC Growth Conference

The foregoing is provided for informational purposes only. Nanometrics assumes no liability for any inaccuracy or inconsistency that may occur in the provided information. Safe Harbor Statement

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