Milpitas, California. July 11, 2007.

Nanometrics Receives Complete Process Control Solution Order From
Major Japanese Flash Memory Manufacturer

Integrated Metrology, Atlas SE and NanoNet Software Package to be Used in one of the World’s Largest 300 mm Wafer Fabs

Nanometrics Incorporated (Nasdaq: NANO), a leading supplier of advanced metrology equipment to the semiconductor industry, today announced it has received a multi-platform order from a major Japanese flash memory manufacturer.  The order, a complete process control solution, will include Nanometrics’ integrated metrology (IM), Atlas SE (spectroscopic ellipsometer) and proprietary NanoNet interconnectivity products.  The metrology package will be used in one of the world’s largest 300 mm wafer fabrication facilities located in Japan.

The order reflects Nanometrics’ unique ability to provide customers with an extensive metrology solution, accelerating time-to-yield in high-volume manufacturing environments. The combination of IM, the Atlas SE system for film characterization, and NanoNet software for overall metrology network interconnectivity will provide both increased process control and seamless recipe development and deployment.

“This multi-platform order substantiates that our metrology strategies are providing the enhanced process control capabilities needed in the most advanced fabs,” said Nathan Coe, Nanometrics’ vice president of global sales. “Our comprehensive process control solutions give our customers a wide range of capabilities that goes unmatched in the industry and will greatly enhance the production of the leading-edge flash memory devices at this facility.”

"The customer's hands-on experience with our integrated metrology systems in current mass production fabs was a major factor in winning this business.  They recognized the added value in areas of enhanced process tool control, productivity gains, and fab-wide metrology interconnectivity, concluding this was a capability necessary for the next major fab project," added Steve Bradley, Nanometrics’ integrated metrology product manager.

About Nanometrics
Nanometrics is a leader in the design, manufacture and marketing of high-performance process control metrology systems used in semiconductor manufacturing. Nanometrics standalone and integrated metrology systems measure various thin film properties, critical dimensions, overlay control and optical, electrical and material properties, including the structural composition of silicon and compound semiconductor devices, during various steps of the manufacturing process. These systems enable semiconductor manufacturers to improve yields, increase productivity and lower their manufacturing costs. The Company maintains its headquarters in Milpitas, California, with sales and service offices worldwide. Nanometrics is traded on NASDAQ Global Market under the symbol NANO. Nanometrics’ website is http://www.nanometrics.com.

Contact
Agency Contact:
Vince Mayeda
Loomis Group
909.590.9324 tel; 909.517.1787 fax
mayedav@loomisgroup.com

Company Contact:
Kevin Heidrich
408-545-6000 tel; 408-232-5910 fax
kheidrich@nanometrics.com