Nanometrics to Present at the SG Cowen & Co. 33rd Annual Technology Conference – June 1, 2005

Nanometrics, Inc. (Nasdaq: NANO), a leading supplier of advanced integrated and standalone metrology equipment for the semiconductor industry, today announced its participation at the upcoming SG Cowen & Co. 33rd Annual Technology Conference, being held June 1-2, 2005 at The Westin New York at Times Square.

Information for this event is as follows:

Event:
SG Cowen & Co. 33rd Annual Technology Conference

Date:
Wednesday, June 1, 2005

Time:
Presentation at 3:30 p.m. ET (12:30 p.m. PT)

Speaker:
John Heaton, President & CEO


A webcast of the presentation will be made available on Nanometrics’ investor web page at www.nanometrics.com.

About Nanometrics
Nanometrics is a leader in the design, manufacture and marketing of high-performance process control metrology systems used in the manufacture of semiconductors, integrated circuits and flat panel displays. Nanometrics metrology systems measure various thin film properties, critical circuit dimensions and layer-to-layer circuit alignment (overlay) during various steps of the manufacturing process, enabling semiconductor and IC manufacturers to improve yields, increase productivity and lower manufacturing costs. The Company maintains its headquarters in Milpitas, CA, with sales and service offices worldwide. Nanometrics is traded on NASDAQ under the symbol NANO. The Company’s website is http://www.nanometrics.com.

Contact:
Peter Gise
Nanometrics
408.435.9600