Nanometrics to Present at the Seventh Annual Needham Growth Conference - January 13, 2005

Nanometrics, Inc. (Nasdaq: NANO), a leading supplier of advanced integrated and standalone metrology equipment for the semiconductor industry, today announced its participation at the Seventh Annual Needham Growth Conference, being held January 10-14, 2005 at the New York Palace Hotel.

Information for this event is as follows:

Event:
The Seventh Annual Needham Growth Conference

Date:
Thursday, January 13, 2005

Time:
Presentation at 9:00 a.m. (Eastern Time)

Speaker:
John Heaton, President & CEO

A webcast of the presentation can be accessed from Nanometrics' website at www.nanometrics.com.

About Nanometrics:
Nanometrics is a leader in the design, manufacture and marketing of high-performance process control metrology systems used in the manufacture of semiconductors, integrated circuits and flat panel displays. Nanometrics metrology systems measure various thin film properties, critical circuit dimensions and layer-to-layer circuit alignment (overlay) during various steps of the manufacturing process, enabling semiconductor and integrated circuit manufacturers to improve yields, increase productivity and lower their manufacturing costs. The Company maintains its headquarters in Milpitas, CA, and sales and service offices worldwide. Nanometrics is traded on NASDAQ under the symbol NANO. Nanometrics’ website is: http://www.nanometrics.com.

Contact:
Paul Nolan
Nanometrics
408.435.9600