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Latest Press Releases
01/23/2012 Nanometrics to Present at the Stifel Nicolaus 2012 Technology & Telecom Conference
01/09/2012 Nanometrics Announces Advanced Metrology Milestone
01/03/2012 Nanometrics to Present at the 14th Annual Needham Growth Conference
11/21/2011 Nanometrics Acquires Nanda Technologies
11/08/2011 Nanometrics Introduces Atlas II OCD System
10/31/2011 Nanometrics TSM Metrology System Selected by Major Solar PV Manufacturer
10/27/2011 Nanometrics Reports Third Quarter 2011 Financial Results
10/25/2011 Nanometrics to Present at Upcoming Investor Conferences
10/05/2011 Nanometrics Atlas XP+ OCD System Selected as “Tool of Record” at Leading Disk Drive Manufacturer
09/26/2011 Nanometrics Wins Multi-System Order for Integrated Metrology
09/14/2011 Nanometrics OCD Metrology Systems Selected by Asian Foundry
08/04/2011 Samsung Adopts UniFire™ Metrology Tool for Advanced Wafer Scale Packaging Development
07/28/2011 Nanometrics Reports Second Quarter 2011 Financial Results
07/25/2011 Nanometrics to Present at Upcoming Investor Conferences
06/09/2011 New NanoCD™ Suite Improves OCD Process Control
05/26/2011 Stephen Newberry Joins Nanometrics Board of Directors
05/25/2011 Nanometrics Opens Singapore Advanced Metrology Center
05/05/2011 Nanometrics to Participate in the Goldman Sachs Midwest Small Cap Conference
05/03/2011 Nanometrics UniFire™ Metrology Tool Adopted for Advanced Packaging Development of Next Generation Memory Devices
04/28/2011 Nanometrics Reports First Quarter 2011 Financial Results
03/14/2011 Nanometrics to Present at the Sidoti & Co. Emerging Growth Institutional Investor Forum and Ring Closing Bell at NASDAQ
03/09/2011 Nanometrics Wins Integrated Metrology Selection from Leading Japanese Semiconductor Company for New Fab Build-out
03/03/2011 Ron Kisling to Join Nanometrics as Chief Financial Officer
02/28/2011 Nanometrics Announces Launch of its Mosaic II Overlay Metrology System and Selection by Leading Asian Customer
02/23/2011 Nanometrics Launches Next Generation UniFire 7900IR for Wafer-to-Wafer Bonding Metrology with Initial Delivery to Leading Logic Manufacturer
02/10/2011 Nanometrics Reports Fourth Quarter and Full Year 2010 Financial Results
01/31/2011 Nanometrics to Present at the Stifel Nicolaus Technology, Communications and Internet Conference
01/10/2011 Nanometrics Announces Order for Complete CD Metrology Solution from Leading Japanese Semiconductor Company
01/03/2011 Nanometrics to Present at the 13th Annual Needham Growth Conference

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