Press Releases
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Latest Press Releases
05/07/2008 Nanometrics Acquires Assets of Tevet Process Control Technologies, Ltd.; Broadens Integrated Metrology Portfolio
04/29/2008 Nanometrics Reports First Quarter 2008 Financial Results
04/03/2008 Nanometrics Introduces Atlas XP Advanced Metrology System
04/03/2008 Nanometrics Names Financial Expert to the Board of Directors
03/19/2008 Nanometrics Names Michael Fischer Head of Worldwide Sales
02/20/2008 Nanometrics Reports Fourth Quarter and Full Year Financial Results for 2007
02/19/2008 Nanometrics Achieves Milestone Shipment of 1,000th Integrated Metrology System
02/13/2008 Nanometrics Names Toho Technology Japan Distributor for its Compound Semiconductor Product Lines
01/30/2008 Nanometrics Introduces NanoCD Suite
01/09/2008 Nanometrics Announces 7% Workforce Reduction
11/08/2007 Nanometrics Announces Purchase of VerteX PL Mapping System by AIXTRON AG
11/05/2007 Nanometrics Names Gary C. Schaefer Chief Financial Officer
10/30/2007 Nanometrics Reports Financial Results for the Third Quarter of 2007
10/04/2007 Nanometrics Introduces Newest Optical CD Metrology Products Enabling Cost-Saving Advanced Process Control
08/27/2007 Nanometrics Completes Real Estate Asset Sales
08/16/2007 Nanometrics Reduces Fixed Costs by Closing Non-Critical Manufacturing Facilities
08/06/2007 Nanometrics Names Timothy J. Stultz Chief Executive Officer
08/01/2007 Nanometrics Reports Financial Results for the Second Quarter of 2007
07/11/2007 Nanometrics Receives Complete Process Control Solution Order From Major Japanese Flash Memory Manufacturer
06/07/2007 Nanometrics Completes Sale of Non-Strategic Product Lines
05/21/2007 Nanometrics Names Industry Veteran to the Board
04/25/2007 Nanometrics Reports Financial Results for the First Quarter of 2007
04/25/2007 Nanometrics Announces Organizational Change
04/12/2007 Nanometrics Announces Settlement of Nova Measuring Patent Litigation
03/29/2007 Nanometrics VerteX Photoluminescence Mapping System Installed at Philips MiPlaza R&D Facilities
03/26/2007 Nanometrics Announces Appointment of Interim CEO
03/20/2007 Nanometrics Announces Global Manufacturing Center for Overlay Metrology
02/26/2007 Nanometrics Introduces New IVS 185 System for CD, Overlay Metrology
02/15/2007 Nanometrics Reports Fourth Quarter and Full Year Financial Results for 2006

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