採用情報

APPLICATION SCIENTIST (JAPAN)

Responsibilities:

You will have the opportunity to work closely with process engineers in Semiconductor Fabs to provide Metrology solutions for complex multi-layer Thin Film measurements, Optical Critical Dimension (Scatterometry) measurements and Overlay measurements for sub-100nm features. Duties will include applications development and characterization of cutting edge measurement technologies, making technology/product presentations and technical training for customers. You will also be responsible for high level Applications support of complex measurement systems used to manufacture Semiconductor devices / integrated circuits.

Requirements:
・MS/PhD in Electrical & Electronics/Mechanical/Chemical/Materials
  Engineering/Physics (Fresh Graduates are encouraged to apply)
・Individuals should be able to work independently requiring minimal supervision
・Strong interpersonal and technical communication skills
・Excellent analytical and troubleshooting skills
If you are a talented, smart, self-driven, self-motivated individual who possess the above qualifications and is willing to take up new challenges, please email complete resume and most recent photograph immediately to:

                                                         The Advertiser
                                             Email：recruit@nanometrics.com


                           Only short listed candidates will be notified for interview