07/14 - 07/16/2015
Semicon West 2015
BOOTH #1405, Moscone Center South
TechXPOT (South) 2015 Session
Nanometrics Presenting at TechXPOT - Materials Session, South Hall
Tuesday, July 14 @ 2:10-2:30 PM PT
Title: Metrology Perspective - High Resolution Topographic Inspection Mapping for Critical Patterning Defectivity Prediction and Detection
NANO: Nasdaq Stock Exchange Closing Bell
Smaller, faster, more sophisticated chips. At 22nm and below, novel designs featuring 3D multi-gate transistors are helping to extend the roadmap for smaller devices. But moving to smaller technology nodes with these new structures presents manufacturing challenges.
Nanometrics offers a suite of process control tools to help manufacturers as they shrink designs to sub 30nm nodes and develop robust solutions for vertical IC integration.